3D TCAD Analysis of Hot-Carrier Degradation Mechanisms in 10 nm Node Input/Output Bulk FinFETs

Home · 3D TCAD Analysis of Hot-Carrier Degradation Mechanisms in 10 nm Node Input/Output Bulk FinFETs

저자

Dokyun Son, Sangbin Jeon, Myounggon Kang and Hyungcheol Shin

저널 정보

Journal of Semiconductor Technology and Science

출간연도

2016

링크