JOURNAL

Capture-cross-section conversion ratio for compact models enabling fast VT distribution simulation of 3-D NAND flash memory

Haechan Choi, Sangmin Ahn, Jinil Yoo, Sungju Kim, Myung Jin and Hyungcheol Shin

2026

Japanese Journal of Applied Physics (JJAP)

Physics-Informed Neural Network for PGM Operation of 3-D CT-NANDs Under Data-Scarce Environments

Jinil Yoo, Haechan Choi and Hyungcheol Shin

2026

IEEE Transactions on Electron Devices (TED)

Time-Step-Free Physics-Based Modeling of Retention Loss in Cryogenic 3-D NAND Flash

Myung Jin, Haechan Choi, and Hyungcheol Shin

2026

IEEE Electron Device Letters (EDL)

Developing an ultimate 3D NAND flash memory simulation environment for operation and optimization

Jooyoung Lee, Jinil Yoo and Hyungcheol Shin

2026

Journal of Computational Electronics (JCE)

Investigation of retention characteristic improvement in reprogram process based on a physical model for 3D NAND flash memory

Jooyoung Lee and Hyungcheol Shin

2026

Journal of Computational Electronics (JCE)

Strategies to Improve Efficiency of Select-Gate Voltage Floating During GIDL-Assisted Erase in 3-D NAND Flash Memory

Sungju Kim; Jaeyeop Jung; Hyungcheol Shin

2026

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)