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A long short-term memory neural network-based approach for retention lifespan prediction in 3D NAND flash memory
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A long short-term memory neural network-based approach for retention lifespan prediction in 3D NAND flash memory
A long short-term memory neural network-based approach for retention lifespan prediction in 3D NAND flash memory
저자
Eunseok Oh and Hyungcheol Shin
저널 정보
Japanese Journal of Applied Physics (JJAP)
출간연도
2026
링크
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Impact of Elliptical Cell Geometry and Program Voltage on RTN-Induced Threshold Voltage Shift in 3-D NAND Flash
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Modeling and Optimization of 3-D Bandgap-Engineered NAND Flash for Program Operation by Multilayer Tunneling With Trap Physics of Tunneling Nitride
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