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Seoul National University Device Research Laboratory

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Home · Analysis and Compact Modeling of Fast Detrapping From Bandgap-Engineered Tunneling Oxide in 3-D NAND Flash Memories
Home · Analysis and Compact Modeling of Fast Detrapping From Bandgap-Engineered Tunneling Oxide in 3-D NAND Flash Memories

Analysis and Compact Modeling of Fast Detrapping From Bandgap-Engineered Tunneling Oxide in 3-D NAND Flash Memories

저자

Minsoo Kim and Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2021

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