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Seoul National University Device Research Laboratory

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Home · Compact Modeling of Trap-Assisted Tunneling Current in 3-D nand Flash Memory
Home · Compact Modeling of Trap-Assisted Tunneling Current in 3-D nand Flash Memory

Compact Modeling of Trap-Assisted Tunneling Current in 3-D nand Flash Memory

저자

Hyungjun Jo, Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices

출간연도

2025

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