바로가기 메뉴
본문 바로가기
푸터 바로가기
서울대학교
Register
Log in
English
Korean
English
English
Korean
Device Research Laboratory
DRL
LECTURE
RESEARCH
PUBLICATIONS
BOARD
사이트맵
Please input keywrod
TOP
Home
·
Distinguishing capture cross-section parameter between GIDL erase compact model and TCAD
Home
·
Distinguishing capture cross-section parameter between GIDL erase compact model and TCAD
Distinguishing capture cross-section parameter between GIDL erase compact model and TCAD
저자
Kul Lee and Hyungcheol Shin
저널 정보
Japanese Journal of Applied Physics
출간연도
2021
링크
Prev
이전
Analysis of the Effect of Residual Holes on Lateral Migration During the Retention Operation in 3-D NAND Flash Memory
다음
Prediction of Random Grain Boundary Variation Effect of 3-D NAND Flash Memory Using a Machine Learning Approach
Next
목록 보기
