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Seoul National University Device Research Laboratory

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Home · Investigation of Random Telegraph Noise Scaling Dependency in 3-D NAND Using Monte Carlo Simulator
Home · Investigation of Random Telegraph Noise Scaling Dependency in 3-D NAND Using Monte Carlo Simulator

Investigation of Random Telegraph Noise Scaling Dependency in 3-D NAND Using Monte Carlo Simulator

저자

Eunseok Oh, Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices

출간연도

2025

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