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Seoul National University Device Research Laboratory

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Home · Prediction of Random Telegraph Noise-induced Threshold Voltage Shift and Its Scaling Dependency Using Machine Learning
Home · Prediction of Random Telegraph Noise-induced Threshold Voltage Shift and Its Scaling Dependency Using Machine Learning

Prediction of Random Telegraph Noise-induced Threshold Voltage Shift and Its Scaling Dependency Using Machine Learning

저자

Eunseok Oh, Hyungcheol Shin

저널 정보

IEEE Journal of the Electron Devices Society

출간연도

2024

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