Separation of Lateral Migration Components by Hole During the Short-Term Retention Operation in 3-D NAND Flash Memories

Home · Separation of Lateral Migration Components by Hole During the Short-Term Retention Operation in 3-D NAND Flash Memories

저자

Shinkeun Kim, Haesoo Kim, Changeom Woo, Gil-Bok Choi, Moon-Sik Seo, Hyunyoung Shim, Keum Hwan Noh, and Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2020

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