Temperature Dependence Modeling of Grain Boundary Barrier Height in Macaroni MOSFETs

Home · Temperature Dependence Modeling of Grain Boundary Barrier Height in Macaroni MOSFETs

저자

Juhyun Kim and Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2023

링크