Thermal-Aware Shallow Trench Isolation Design Optimization for Minimizing IOFF in Various Sub-10-nm 3-D Transistors

Home · Thermal-Aware Shallow Trench Isolation Design Optimization for Minimizing IOFF in Various Sub-10-nm 3-D Transistors

저자

Ilho Myeong, Dokyun Son, Hyunsuk Kim, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2019

링크