컨퍼런스(국내)

Conference
A Compact Model for GIDL-Assisted Erase Transients of 3D MONOS Charge-Trap NAND Flash Memories
[2025 EDTM] Investigation of Reliability and Optimization of Reprogram Process in 3D NAND Flash Memory Based on Physical Model
[2025 ESSERC] Negative Boosting Control of Channel Potential in Open Block Read Operation for 3D NAND Flash Memory
[2024 MRS] Processing and Characterization of Polycrystalline Silicon for Ultra-Low-Power Neuromorphic Applications
[2024 EDTM] A Compact Model for Program Operation of Gate-All-Around Barrier-Engineered Charge-Trapping NAND Flash Memories
[2024 EDTM] A Compact Model-Based Threshold Voltage Distribution Simulation of 3D Gate-All-Around (GAA) NAND Flash memories