컨퍼런스(국내)

Conference
[2016 IVC] Impact of Line Edge Roughness (LER) on Single and Three Stacked Nanowire FET in Ultra-sca
[2016 IVC] Analysis of On Current-boosting and Hot Carrier Degradation Considering Trenched Source/D
[2016 IVC] Analysis on Self Heating Effect on Trench Structure in 5 nm node 3D Stacked Nanowire FET
[2015 AWAD] Calculation of Capture Cross Section with Considering Tunneling Probability in 21nm NAND
[2015 AWAD] Analysis of Band to Band Tunneling Characteristics according to the impact of Traps in c
[2015 AWAD] The Comparison of trap characteristics with trap type under TAT Gate-Induced Drain Leaka