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[2015 ITC-CSCC] Comparison of GIDL mechanism between MOSFET and FinFET
[2015 AWAD] Impact of Trap Position on Random Telegraph Noise in a 70-Å Nanowire Field-Effect Transi
[2015 AWAD] Analysis of Capacitance-Voltage Characteristic according to Non-uniform fixed charge in
[2015 AWAD] 3D TCAD Analysis of Hot-Carrier Degradation Mechanisms in 10 nm node I/O Bulk
[2015 AWAD] Analysis on Self-Heating Effect in 7 nm node Bulk FinFET device
[2015 ITC-CSCC] Analysis of GIDL in PMOS SiGe FinFETs under Various Dit Conditions
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