컨퍼런스(국내)

Conference
[2015 AWAD] Analysis of Capacitance-Voltage Characteristic according to Non-uniform fixed charge in
[2015 AWAD] 3D TCAD Analysis of Hot-Carrier Degradation Mechanisms in 10 nm node I/O Bulk
[2015 AWAD] Analysis on Self-Heating Effect in 7 nm node Bulk FinFET device
[2015 ITC-CSCC] Analysis of GIDL in PMOS SiGe FinFETs under Various Dit Conditions
[2015 ITC-CSCC] Trap Type Dependence of Modulation in TAT GIDL
[2014 SNW] Analysis on Trapping Mechanism of Trap Causing Gate-Induced Drain Leakage Current Random