컨퍼런스(국내)

Conference
[2015 ITC-CSCC] Trap Type Dependence of Modulation in TAT GIDL
[2014 SNW] Analysis on Trapping Mechanism of Trap Causing Gate-Induced Drain Leakage Current Random
[2014 SNW] Minimum Operation Voltage of 6T-SRAM Cell Composed of 90Å Bulk-FinFET Considering Oxide T
[2014 SNW] Simple Design Guideline for Negative Capacitance FET Using Ferroelectric Materials
[2014 SNW] Impact of Line Edge Roughness on RTN in SRAM Cells with 70 Å Nanowire FET
[2014 ESSDERC] Analysis of Failure Mechanisms in Erased State of Sub 20-nm NAND Flash Memory