컨퍼런스(국내)

Conference
[2010 SNW] Effects of Aluminum Layer and Oxidation on TIO2 based Bipolar Resistive Random Access Mem
[2010 IMW] A Comparative Study of the Program Efficiency of Gate All around SONOS and TANOS Flash Me
[2010 IMW] Novel 3-D Stacked NAND Flash String without Body Cross-Talk Effect
[2009 IEDM] Characterization of oxide traps leading to RTN in high-k and metal Gate MOSFETs
[2009 IEDM] RTS-like fluctuation in gate induced drain leakage current of saddle-fin Type DRAM cell
[2009 ISDRS] Fabrication and Characterization of Buried-Gate Fin and Recess Channel MOSFET for High