컨퍼런스(국내)

Conference
[2020 EDTM] Analysis on Process Variation Effect of 3D NAND Flash Memory Cell through Machine Learni
[2020 EDTM] Compact Model of Read Disturbance by Hot Carrier Injection in 3D NAND Flash Memory
[2020 EDTM] Compact Model of Read Disturbance by Hot Carrier Injection in 3D NAND Flash Memory
[2020 EDTM] Methodology to Predict Random Telegraph Noise Induced Threshold Voltage Shift Using Mach
[2020 IRPS] Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Progr
[2019 SNW] Modeling of Lateral Migration Mechanism of Holes in 3D NAND Flash Memory Charge Trap Laye