컨퍼런스(국내)

Conference
[2009 SNW] Novel Multi-Bit Structure and Its Mechanism for High Density Resistive Random Access Memo
[2009 SNW] An Access-Transistor or Diode-Free (0T or 0D/2R) Resistance Random Access Memory (RRAM) U
[2009 SNW] Buried-Gate Fin and Recess Channel MOSFET for Sub-30 nm DRAM Cell Transistors with High P
[2009 International Conference on Integrated Circuit Design and Technology] Hot carrier stress effec
[2008 International Electron Device Meeting, IEDM] Random telegraph noise in N-type and P-type silic
[2008 The 2nd IEEE Nanotechnology Materials and Devices Conference] High Performance RF Characterist