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[2008 The 9th International Conference on Solid-State and Integrated-Circuit Technology] Prediction
[2008 International Conference on Solid State Devices and Materials] Accurate channel thermal noise
[2008 International Conference on Solid State Devices and Materials] Analysis of fowler-nordheim str
[2008 International Conference on Solid State Devices and Materials] Analytic parameter extraction o
[2008 International Conference on Solid State Devices and Materials] Extraction of vertical, lateral
[2008 International Conference on Solid State Devices and Materials] Temporal noise analysis and its
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