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[2008 International Conference on Solid State Devices and Materials] Accurate channel thermal noise
[2008 International Conference on Solid State Devices and Materials] Analysis of fowler-nordheim str
[2008 International Conference on Solid State Devices and Materials] Analytic parameter extraction o
[2008 International Conference on Solid State Devices and Materials] Extraction of vertical, lateral
[2008 International Conference on Solid State Devices and Materials] Temporal noise analysis and its
[2008 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices] 3-di
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