컨퍼런스(국내)

Conference
[2007 International Semiconductor Device Research Symposium] Fin Width Variation Effects on Program Disturbance Characteristics in a NAND Type Bulk Fin SONOS Flash Memory
[2007 International Semiconductor Device Research Symposium] A Novel Gated Transmission Line Method for Organic Thin Film Transistors
[TENCON 2007] Analytic approach to power-constrained CMOS low-noise amplifier design with figure of merit consideration
[2007 International Conference on Solid State Devices and Materials] An Analytic Current-Voltage Equation for Top-contact OTFTs Including the Effects of Variable Series Resistance
[2024 KCS] Quantitative Analysis on Z-Interference using Reprogram Scheme in 3D NAND Flash Memory Vth Distribution
[2024 KCS] Process Variability Analysis in 3D NAND Macaroni Structures : Machine Learning for Predicting Program and Erase Characteristics