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[2008 Silicon Nanoelectronics Workshop] Fabrication and Improved Characteristics of Self-Aligned Dual-Gate Single-Electron Transistors
[2008 International Workshop on compact modeling] Compact model of symmetric double-gate MOSFETs with doped channel in subthreshold region
[2008 International Workshop on compact modeling] Extraction of coulomb-limited mobility in sub-50 nm MOSFETs
[2008 International Workshop on compact modeling] Parameter extraction of 60 nm RF MOSFET with π-type substrate resistance using four-port measurement
[2008 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems] Suppression of digital noise coupling on LNA in 0.13-um RFCMOS technology by global guard rings
[2007 International Semiconductor Device Research Symposium] Fin Width Variation Effects on Program Disturbance Characteristics in a NAND Type Bulk Fin SONOS Flash Memory
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