컨퍼런스(국내)

Conference
[2023 대한전자공학회 하계학술대회] The Investigation of Random Telegraph Noise effect on the Extremely Narrow Vth Distribution in 3D NAND Flash Memory
[2023 대한전자공학회 하계학술대회] A Compact Model for Transient Program Operation of Barrier Engineered Charge-Trapping NAND Flash Memories
[2019 KCS] Interplay Between Line Edge Roughness and Interface Traps in Nanoplate VFETs
[2019 KCS] Optimization of Vertical Nanowire Transistors for 3.5 nm Technology Node
[2019 KCS] Comparison of Self-heating Effects in 3.5nm Node Nanoplate-FET Using Corner Spacer
[2019 KCS] Analysis of Hot Carrier Degradation in Short Channel MOSFET according to Temperature