컨퍼런스(국내)

Conference
[2019 AWAD] Effect of Cell Scaling on Lateral Migration of Holes in VNAND Flash Memory
[2019 AWAD] Analysis of Threshold Voltage Fluctuation by Trap Effects in Macaroni-type 3D NAND Flash
[2019 AWAD] Compact Model for Program Operation of 3D NAND Flash Memories using TCAD and SPICE
[2019 SNW] Prediction of Characteristics of Future Scaled 3D NAND Flash Memory by Using TCAD and SPI
[2019 SNW] Effect of Device Scaling on Lateral Migration Mechanism of Electrons in V-NAND
[2019 VLSI] Modeling of Charge Loss Mechanisms during the Short Term Retention Operation in 3-D NAND