컨퍼런스(국내)

Conference
[2010 Korean Conference on Semiconductors] A Surface Potential Model for Recessed Channel MOSFETs in Strong Inversion
[2010 Korean Conference on Semiconductors] De-embedding accuracy for interconnection variation
[2010 Korean Conference on Semiconductors] Drain Bias Effect on Quasi-Ballistic Transport in Ultra-Short Channel MOSFETs
[2010 Korean Conference on Semiconductors] Fluctuation-Robust Extended Word-line and Extended Bit-line (EWEB) NAND Flash Memory
[2010 Korean Conference on Semiconductors] Investigation of capture and emission process dependency between individual traps from complex RTS Noise
[2010 Korean Conference on Semiconductors] Modeling of Vth Shift of Gate-All-Around SONOS Flash Memory