컨퍼런스(국내)

Conference
[2009 한국 반도체 학술대회] Extraction of locations and energy levels of oxide traps from multi-level RTS noise
[2009 한국 반도체 학술대회] FN stress induced degradation on random telegraph noise in N-type silicon nanowire transistor
[2007 Silicon Nanoelectronics Workshop] Drain voltage dependency of random telegraph signal noise in nano scale MOSFETs_
[2009 한국 반도체 학술대회] A new method for lateral location of oxide traps extraction in short channel MOSFETs
[2009 한국 반도체 학술대회] Comparison of deembedding techniques for RF CMOS device scaling-down
[2009 한국 반도체 학술대회] The modeling of metal layers and vias in RF MOSFET for accurate circuit design