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[2007 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devieces] FN stress induced degradation on random telegraph signal noise in deep submicron NMOSFETs
[2007 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices] Low cost CMOS LNA design using thin-metal CMOS process
[2007 Silicon Nanoelectronics Workshop] Small-signal model of MOSFETs with effective channel length of 50nm
[2007 Silicon Nanoelectronics Workshop] Trench Tunneling Barrier Single-Electron Transistors (TSETs) Using Bandgap Increase by Quantum Confinement Effect
[2007 Silicon Nanoelectronics Workshop] A Capacitor-less 1T DRAM Cell with High Sensing Margin
[2007 Silicon Nanoelectronics Workshop] New Capacitor-less 1T DRAM Cell Based on a Double Gate MOSFET with Vertical Channel (DGVC Cell)
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