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[2007 International Reliability Physics Symposium] Improving the endurance characteristics through boron implant at active edge in 1G NAND flash_
[2007 International Workshop on compact modeling] Analysis for modeling error in a macro-model of RF MOSFETs up to 110 GHz
[2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems] Extraction of effective carrier velocity in RF MOSFETs
[2006 International Electron Devices Meeting, IEDM] Improving the cell characteristics using low-k gate spacer in 1Gb NAND flash memory
[2006 International Conference on Semiconductor Electronics] Integrated LC VCO Compatible with Memory Process for Gigahertz Clock Generation
[2006 International Conference on Semiconductor Electronics] Performance Improvement of OTFTs using Double Layer Insulator
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