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[2006 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices] Analyses on Current Characteristics of 3-D MOSFET Nonvolatile Memory Devices Determined by Junction Doping Profiles
[2006 Device Research Conference] Complete quasi-static modeling of 130nm RF MOSFETs
[2006 Device Research Conference] Extraction of Accumulation Mobility from C-V Characteristics of Pentacene MIS Structures
[2006 Device Research Conference] Random telegraph noise in 130 nm n-MOS and p-MOS transistors
[2006 Silicon Nanoelectronics Workshop] Nano-scale Resistive Probe for Recording Applications
[2006 Silicon Nanoelectronics Workshop] Fabrication and Characterization of Tri-Gate Field-induced Inter-band Tunneling Effect Transistors (TG-FITETs)
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