컨퍼런스(국내)

Conference
[2008 The 15th Korean Conference on Semiconductors] Random noise analysis in CMOS image sensor readout circuit
[2008 The 15th Korean Conference on Semiconductors] RF modeling of ultra-short-channel MOSFETs in subthreshold region
[2008 The 15th Korean Conference on Semiconductors] Silicon resistive probe with improved resolution
[2008 The 15th Korean Conference on Semiconductors] Simple model for the MOSFET channel thermal noise
[2008 The 15th Korean Conference on Semiconductors] The drain voltage dependence of RTS noise in flash memory having the floating gate
[2007 IEEK Fall Conference] 소스/드레인 영역에 언더랩 구조를 갖는 10 nm FinFET 설계