컨퍼런스(국내)

Conference
[2018 AWAD] Analysis of NBTI considering the Trap Characteristics: Location and Generation Rates
[2017 SNW] Analysis of Two Divided Component of NBTI Framework using TCAD simulation
[2017 SNW] Comparison of Parasitic Components between LFET and VFET using 3D TCAD
[2017 SNW] Analysis of Self-Heating Effects in Vertical MOSFETs According to Device Geometry
[2017 SNW] Analysis of RC Delay for High Performance in LFETand VFET
[2017 SNW] Improvement of Dual-k spacer for Nanowire-FETs considering Circuit Delay and Electricstat