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[2007 The 14th Korean Conference on Semiconductors] Lateral Profiling of Interface States in SONOS Flash Memories Using the Optical Charge Pumping Method
[2007 The 14th Korean Conference on Semiconductors] Extraction of the Interface Trap Density in SONOS Flash Memory Cell Transistors by Optical Subthreshold Current Method
[2007 The 14th Korean Conference on Semiconductors] Characterization of Tunnel Oxide Degradation under NAND-type Program/Erase Stresses of SONOS Flash Memory Cell Transistors with 30 nm×30 nm Channel
[2007 The 14th Korean Conference on Semiconductors] ” Narrow Width Effect of an NROM-type SONOS Flash Memory Device on Program/Erase Cycling Behavior
[2007 The 14th Korean Conference on Semiconductors] Extraction of Si3N4 Trap Density Distribution in SONOS Flash Memories based on Optical C-V Method
[2007 The 14th Korean Conference on Semiconductors] Capacitorless 1T DRAM Cell based on a Partially Depleted SOI MOSFET with Multi Body Doping Structure
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