컨퍼런스(국내)

Conference
[2006 The 13th Korean Conference on Semiconductors] Isolation Method for Bulk FinFET without Using CMP Process
[2006 The 13th Korean Conference on Semiconductors] Room Temperature Negative-Differential Trans-conductance Characteristics of Tri-Gate FITET
[2006 The 13th Korean Conference on Semiconductors] Nano-scale Resistive Probe Tip with High Resolution
[IEEK Fall Conference 2005] Extraction of substrate resistance parameters for RF MOSFETs based on three-port measurement
[IEEK Fall Conference 2005] Linearity optimization of DG MOSFETs for RF applications
[IEEK Fall Conference 2005] Low frequency noise characteristics of the 180nm MOSFETs