컨퍼런스(국내)

Conference
[IEEK Fall Conference 2005] Extraction of substrate resistance parameters for RF MOSFETs based on three-port measurement
[IEEK Fall Conference 2005] Linearity optimization of DG MOSFETs for RF applications
[IEEK Fall Conference 2005] Low frequency noise characteristics of the 180nm MOSFETs
[IEEK Fall Conference 2005] Analysis of input power matching for CMOS RF low noise amplifier design
[IEEK Fall Conference 2005] Write characteristics of silicon resistive probe
[IEEK Fall Conference 2005] The Effects of Corner Transistors in STI-isolated SOI MOSFETs