컨퍼런스(국내)

Conference
[2005 The 12th Korean Conference on Semiconductors] Erase Characteristics of p-Channel Bulk FinFET SONOS Flash Memory with Fin Width
[2005 The 12th Korean Conference on Semiconductors] Small Signal Modeling of FinFETs
[2005 The 12th Korean Conference on Semiconductors] Gate conduction mechanism in nonvolatile DRAM cell transistors
[2005 The 12th Korean Conference on Semiconductors] Model for device degradation in SONOS transistors
[2005 SEMICON Korea Technology Symposium] Modeling and parameter extraction of RF MOSFETs
[2004 The 11th Korean Conference on Semiconductors] Biased Spacer MOSFETs Suitable for High Packing Density