컨퍼런스(국내)

Conference
Analytical thermal noise model suitable for circuit design using short-channel MOSFETs
Device degradation model for stacked-ONO gate structure with using SONOS and MOS transistors
Performance Improvement of Scaled-down Top-contact OTFTs by Two-Step-Deposition of Pentacene
Extraction and Modeling of Gate Electrode Resistance In RF MOSFETs
Study on Sensitivity and Resolution of Resistive Probe by 3-D Device Simulation
A Simple Parameter Extraction Method of Wide-Band on-Chip Inductor