이정형, 손영훈, S.D.Lee, J.H.Ahn, 신형철, 박영준, 민홍식, “Model for device degradation in SONOS transistors,” The 12th Korean Conference on Semiconductors, Seoul, Korea, pp.381-382, Feb. 24-25, 2005
기간
Feb. 24-25, 2005
참가자
이정형, 손영훈, S.D.Lee, J.H.Ahn, 신형철, 박영준, 민홍식
대회명
The 12th Korean Conference on Semiconductors
이정형, 손영훈, S.D.Lee, J.H.Ahn, 신형철, 박영준, 민홍식, “Model for device degradation in SONOS transistors,” The 12th Korean Conference on Semiconductors, Seoul, Korea, pp.381-382, Feb. 24-25, 2005