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[2006 Device Research Conference] Random telegraph noise in 130 nm n-MOS and p-MOS transistors

기간

June. 2006

참가자

Youngchang Yoon, Hochul Lee, In Man Kang, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin

대회명

Device Research Conference

Youngchang Yoon, Hochul Lee, In Man Kang, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin, “Random telegraph noise in 130 nm n-MOS and p-MOS transistors”, Device Research Conference, Penn State Univ., U. S. A., pp.283-284, June. 2006