Home · [2006 Device Research Conference] Random telegraph noise in 130 nm n-MOS and p-MOS transistors
Home · [2006 Device Research Conference] Random telegraph noise in 130 nm n-MOS and p-MOS transistors
[2006 Device Research Conference] Random telegraph noise in 130 nm n-MOS and p-MOS transistors
기간
June. 2006
참가자
Youngchang Yoon, Hochul Lee, In Man Kang, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin
대회명
Device Research Conference
Youngchang Yoon, Hochul Lee, In Man Kang, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin, “Random telegraph noise in 130 nm n-MOS and p-MOS transistors”, Device Research Conference, Penn State Univ., U. S. A., pp.283-284, June. 2006