Jongwook Jeon, Yujo Yun, Y.W. Kim, Hyungcheol Shin, “A new analytical model for channel thermal noise of deep-submicron RF MOSFETs”, International SoC Design Conference, Seoul, Korea, pp.409-410, Oct. 2006
기간
Oct. 2006
참가자
Jongwook Jeon, Yujo Yun, Y.W. Kim, Hyungcheol Shin
대회명
International SoC Design Conference
Jongwook Jeon, Yujo Yun, Y.W. Kim, Hyungcheol Shin, “A new analytical model for channel thermal noise of deep-submicron RF MOSFETs”, International SoC Design Conference, Seoul, Korea, pp.409-410, Oct. 2006