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Home · [2007 IEEK Fall Conference] Effects of the Gate-Source Overlap Region of the Staggered Thin-Film Transistors on the Uniformity
Home · [2007 IEEK Fall Conference] Effects of the Gate-Source Overlap Region of the Staggered Thin-Film Transistors on the Uniformity

[2007 IEEK Fall Conference] Effects of the Gate-Source Overlap Region of the Staggered Thin-Film Transistors on the Uniformity

기간

November 24, 2007

참가자

Keum-Dong Jung, Yoo Chul Kim, Byeong-Ju Kim, Byung-Gook Park, Hyungcheol Shin, and Jong Duk Lee

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2007 IEEK Fall Conference

Keum-Dong Jung, Yoo Chul Kim, Byeong-Ju Kim, Byung-Gook Park, Hyungcheol Shin, and Jong Duk Lee, “Effects of the Gate-Source Overlap Region of the Staggered Thin-Film Transistors on the Uniformity,” 2007 IEEK Fall Conference, pp.343-344, Seoul, Korea, November 24, 2007

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