[2007 Silicon Nanoelectronics Workshop] Drain voltage dependency of random telegraph signal noise in nano scale MOSFETs_

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[2007 Silicon Nanoelectronics Workshop] Drain voltage dependency of random telegraph signal noise in nano scale MOSFETs_

기간

Jun. 2007

참가자

Lee Hochul , Youngchang Yoon , Jun Jongwook , Hyungcheol Shin

대회명

Silicon Nanoelectronics Workshop

Lee Hochul , Youngchang Yoon , Jun Jongwook , Hyungcheol Shin, “Drain voltage dependency of random telegraph signal noise in nano scale MOSFETs_”, Silicon Nanoelectronics Workshop, pp.43-44, Jun. 2007

[2007 Silicon Nanoelectronics Workshop] Drain voltage dependency of random telegraph signal noise in nano scale MOSFETs_

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