[2007 The 14th Korean Conference on Semiconductors] Extraction of the electron capture cross section from the RTS noise data in MOSFETs,

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Home · [2007 The 14th Korean Conference on Semiconductors] Extraction of the electron capture cross section from the RTS noise data in MOSFETs,

[2007 The 14th Korean Conference on Semiconductors] Extraction of the electron capture cross section from the RTS noise data in MOSFETs,

기간

Feb. 8-9, 2007

참가자

Hochul Lee, Youngchang Yoon, and Hyungcheol Shin

대회명

The 14th Korean Conference on Semiconductors

Hochul Lee, Youngchang Yoon, and Hyungcheol Shin, “Extraction of the electron capture cross section from the RTS noise data in MOSFETs,”, The 14th Korean Conference on Semiconductors, Seogwipo, Korea, pp.623-624, Feb. 8-9, 2007

[2007 The 14th Korean Conference on Semiconductors] Extraction of the electron capture cross section from the RTS noise data in MOSFETs,

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