Younghwan Son ; Hyungcheol Shin, “Analysis of fowler-nordheim stress induced trap Generation on random telegraph signal noise”, International Conference on Solid State Devices and Materials, pp.442-443, Sep. 2008
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Younghwan Son ; Hyungcheol Shin, “Analysis of fowler-nordheim stress induced trap Generation on random telegraph signal noise”, International Conference on Solid State Devices and Materials, pp.442-443, Sep. 2008