Bong Chan Kim ; Jun Jongwook ; Hyungcheol Shin, “Temporal noise analysis and its reduction method in CMOS imager readout circuit”, International Conference on Solid State Devices and Materials, pp.278-279, Sep. 2008
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Bong Chan Kim ; Jun Jongwook ; Hyungcheol Shin, “Temporal noise analysis and its reduction method in CMOS imager readout circuit”, International Conference on Solid State Devices and Materials, pp.278-279, Sep. 2008