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[2008 International Electron Device Meeting, IEDM] Random telegraph noise in N-type and P-type silic

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Seungwon Yang, Kyoung Hwan Yeo, Dong-Won Kim, Kang-ill Seo, Donggun Park, Gyoyoung Jin, KyungSeok Oh, Hyungcheol Shin, “Random telegraph noise in N-type and P-type silicon nanowire transistors,” 2008 International Electron Device Meeting, pp. 765-768, Dec. 2008