[2008 International Workshop on compact modeling] Parameter extraction of 60 nm RF MOSFET with π-type substrate resistance using four-port measurement

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Home · [2008 International Workshop on compact modeling] Parameter extraction of 60 nm RF MOSFET with π-type substrate resistance using four-port measurement

[2008 International Workshop on compact modeling] Parameter extraction of 60 nm RF MOSFET with π-type substrate resistance using four-port measurement

기간

Jan. 2008

참가자

Lee Jaehong , Yoon Yeonam and Hyungcheol Shin

대회명

International Workshop on compact modeling

Lee Jaehong , Yoon Yeonam and Hyungcheol Shin, “Parameter extraction of 60 nm RF MOSFET with π-type substrate resistance using four-port measurement”, International Workshop on compact modeling, pp.71-73, Jan. 2008

[2008 International Workshop on compact modeling] Parameter extraction of 60 nm RF MOSFET with π-type substrate resistance using four-port measurement

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