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[2008 Silicon Nanoelectronics Workshop] White noise characteristic of nanoscale MOSFETs in all operation regions

기간

Jun. 2008

참가자

Jun Jongwook, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin

대회명

Silicon Nanoelectronics Workshop

Jun Jongwook, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin, “White noise characteristic of nanoscale MOSFETs in all operation regions”, Silicon Nanoelectronics Workshop, pp.0-0, Jun. 2008