Seongjae Cho, Jung Hoon Lee, Yoon Kim, Jang-Gn Yun, Hyungcheol Shin, and Byung-Gook Park, “Study on Dependence of Self-Boosting Channel Potential on Device Scale and Doping Concentration in 2-D and 3-D NAND-Type Flash Memory Devices”, 2009 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices, Busan, Korea, 3B.8, June 24-26, 2009