Jang-Gn Yun, Il Han Park, Seongjae Cho, Jung Hoon Lee, Gil Sung Lee, Doo-Hyun Kim, Yoon Kim, Dong-Hua Lee, Se-Hwan Park, Won-Bo Sim, Wandong Kim, Jong Duk Lee, Hyungcheol Shin, and Byung-Gook Park, “Multi-Bit Gated-Diode Flash Memory”, The 16th Korean Conference on Semiconductors, Deajeon, Korea, pp. 300-301, Feb. 18-20, 2009