Sunyoung Park, Sanghoon Lee, Yeonsung Kang, Byung-Gook Park, Jong-Ho Lee, Jooyoung Lee, Gyoyoung Jin, and Hyungcheol Shin, “Extracting Accurate Position and Energy Level of Oxide Trap Generating Random Telegraph Noise(RTN) in Recessed Channel MOSFET’s,” European Solid-State Device Research Conference, pp. 337-340, Sep. 2010