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[2010 Korean Conference on Semiconductors] De-embedding accuracy for interconnection variation

기간

Feb. 2010

참가자

Jaeho Lee, Jaehong Lee, Byung-Gook Park, Jong Duk Lee, and Hyungcheol Shin

대회명

Korean Conference on Semiconductors

Jaeho Lee, Jaehong Lee, Byung-Gook Park, Jong Duk Lee, and Hyungcheol Shin, “De-embedding accuracy for interconnection variation,” Korean Conference on Semiconductors, pp. 252-253, Feb. 2010