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Home · [2010 Korean Conference on Semiconductors] Drain Bias Effect on Quasi-Ballistic Transport in Ultra-Short Channel MOSFETs
Home · [2010 Korean Conference on Semiconductors] Drain Bias Effect on Quasi-Ballistic Transport in Ultra-Short Channel MOSFETs

[2010 Korean Conference on Semiconductors] Drain Bias Effect on Quasi-Ballistic Transport in Ultra-Short Channel MOSFETs

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Feb. 2010

참가자

Jaehong Lee, Yongmin Kwon, Junghwan Ji, Jong-Ho Lee, Byung-Gook Park, and Hyungcheol Shin

대회명

Korean Conference on Semiconductors

Jaehong Lee, Yongmin Kwon, Junghwan Ji, Jong-Ho Lee, Byung-Gook Park, and Hyungcheol Shin, “Drain Bias Effect on Quasi-Ballistic Transport in Ultra-Short Channel MOSFETs,” Korean Conference on Semiconductors, pp. 435-436, Feb. 2010

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