Sunghun Jung, Jeong-Hoon Oh, Kyung-Chang Ryoo, Se Hwan Park, Jong-Ho Lee, Hyungcheol Shin, and Byung-Gook Park, “Variation of Switching Characteristics Dependent on Contact Area in Unipolar Resistive-Switching Random Access Memory (RRAM),” 하계 종합 학술발표회 논문집, pp. 699-700, Jun. 2010